| Обозначение | Заглавие на русском языке | Статус | Язык документа | Цена (с НДС 20%)
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Waveguide type dielectric resonators - Part 4: Sectional specification
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Single crystal wafers for surface acoustic wave(SAW) device applications - Specifications and measuring methods
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Radio frequency(RF) bulk acoustic wave(BAW) filters of assessed quality - Part 1: Generic specification
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Surface acoustic wave(SAW) and bulk acoustic wave(BAW) duplexers of assessed quality - Part 1: Generic specification
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Surface acoustic wave(SAW) and bulk acoustic wave(BAW) duplexers of assessed quality - Part 2: Guidelines for the use
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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4: Short-term frequency stability test methods
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Piezoelectric sensors - Part 1: Generic specifications
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Piezoelectric sensors - Part 2: Chemical and biochemical sensors
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Piezoelectric sensors - Part 3: Physical sensors
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Guidelines for the measurement method of power durability for surface acoustic wave(SAW) and bulk acoustic wave(BAW) devices in radio frequency(RF) applications
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Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4: Method for the measurement of the load resonance frequency f L , load resonance resistance R L and the calculation of other derived values of quartz crystal units, up to 30 MHz
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Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric, dielectric and electrostatic oscillators
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